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Vision Inspection Systems
Compare VISION INSPECTION and MEASURING SYSTEMS. See the latest in vision inspection and measuring system technology. Vision inspection systems for industrial application have been in use for many years. The algorithms and software were developed in the 60 ties by NASA and the military for satellite inspection for defense. Over the years this technology was made public. This along with the increase in computer power at lower cost has made it a tremendous tool for many industrial and commercial applications.
CCD vision cameras measure an object placed in its field of vision. Proper lighting and optics systems determine the visibility of desired parameters to be viewed or measured. The models listed here come with lighting and optics installed along with software and instructions for proper operation.
Vision measuring systems are primarily used in a laboratory environment. With color CCD cameras, inspection by color analysis or differentiation has added another tool to the great variety of inspection tools possible. Unlike with optical comparators, vision measuring system can come with large tables with long X and Y axis travel. The combination of camera and scanning table depends on the need of the user.
The monitors of vision systems and cameras are primarily color, but black and white is used for very precise dimensional measurements. Here the pixels of the CCD camera can be solely applied for edge detection or the 256 grey shade profile. In a color camera, these pixels have to share the blue/green/red detection analysis. This is at the cost of edge detection resolution.
The color CCD camera, however, gives the vision system the ability to detect and differentiate surface color. This along with dimension measurement makes it ideal for circuit board and chip inspection.
Stage size and travel is important for dimensional inspection. Stage travel can be manual or CNC. The CNC drive is particularly useful for computerized inspection of large objects. Most inspection is two dimensional. Limited three dimensional inspection is possible
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